High-Voltage Pulse Instabilities in SiC Schottky Diodes...

Materials Science Forum 2002 Vol. 389-393

High-Voltage Pulse Instabilities in SiC Schottky Diodes with Implanted Resistive Edge Terminations

Morisette, D.T., Cooper, James A.
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Volume:
389-393
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.389-393.1157
File:
PDF, 325 KB
2002
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