Interior Degradation Analysis of Distributed Feedback Laser Using Optical-Beam-Induced Current
Takeshita, T., Oda, K., Mawatari, H.Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2014.2369420
Date:
December, 2014
File:
PDF, 870 KB
english, 2014