Structural Characterization of Epitaxial Si / Pr2O3 /...

Structural Characterization of Epitaxial Si / Pr2O3 / Si(111) Heterostructures

Zaumseil, P., Schroeder, T., Weidner, G.
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Volume:
108-109
Year:
2005
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.108-109.741
File:
PDF, 836 KB
english, 2005
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