Device-Level Experimental Observations of NBTI-Induced...

IEEE Transactions on Device and Materials Reliability 2014 / 12 Vol. 14; Iss. 4

Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter

Jiao, G. F., Lu, J. W., Campbell, J. P., Ryan, J. T., Cheung, Kin P., Young, C. D., Bersuker, G.
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Volume:
14
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2014.2354339
Date:
December, 2014
File:
PDF, 825 KB
english, 2014
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