N + P photodetector characterization using the quasi-steady state photoconductance decay method
Esebamen, Omeime XerviarVolume:
33
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/33/12/123002
Date:
December, 2012
File:
PDF, 761 KB
english, 2012