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Optical surface profile tracking for high-resolution strain measurement
Arthington, M R, Siviour, C R, Petrinic, N, Elliott, B C FVolume:
22
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/22/2/025304
Date:
February, 2011
File:
PDF, 429 KB
english, 2011