Volume 22; Issue 2

7

Scanning probe microscope dimensional metrology at NIST

Year:
2011
Language:
english
File:
PDF, 1.33 MB
english, 2011
8

A wavelet multiscale denoising algorithm for magnetic resonance (MR) images

Year:
2011
Language:
english
File:
PDF, 1.89 MB
english, 2011
12

Nanometrology using a through-focus scanning optical microscopy method

Year:
2011
Language:
english
File:
PDF, 2.34 MB
english, 2011
17

A hybrid waveguide cell for the dielectric properties of reservoir rocks

Year:
2011
Language:
english
File:
PDF, 563 KB
english, 2011
26

The technique of dithering —a parameter study

Year:
2011
Language:
english
File:
PDF, 1.25 MB
english, 2011
44

Using simulation to check uncertainty calculations

Year:
2011
Language:
english
File:
PDF, 238 KB
english, 2011
45

Sub-threshold sampling in a correlation-based ultrasonic spectrometer

Year:
2011
Language:
english
File:
PDF, 662 KB
english, 2011
48

X-cut quartz crystal impedance meter for liquid characterization

Year:
2011
Language:
english
File:
PDF, 659 KB
english, 2011
50

Nanometrology

Year:
2011
Language:
english
File:
PDF, 602 KB
english, 2011