Phonon Spectroscopy of Low-Energy Excitations of Defects in...

Phonon Spectroscopy of Low-Energy Excitations of Defects in Semiconductors

Lassmann, K.
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Volume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.1563
File:
PDF, 584 KB
1995
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