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Electrical Activity of Structural Defects in 3C-SiC
Eriksson, Jens, Roccaforte, Fabrizio, Weng, Ming Hung, Giannazzo, Filippo, Lorenzzi, Jean, Raineri, VitoVolume:
679-680
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.679-680.273
Date:
March, 2011
File:
PDF, 1.32 MB
english, 2011