Suppression of Read Disturb Fail Caused by Boosting Hot...

IEEE Electron Device Letters 2014 / 01 Vol. 35; Iss. 1

Suppression of Read Disturb Fail Caused by Boosting Hot Carrier Injection Effect for 3-D Stack NAND Flash Memories

Choe, Byeong-In, Lee, Jung-Kyu, Park, Byung-Gook, Lee, Jong-Ho
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Volume:
35
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2013.2288991
Date:
January, 2014
File:
PDF, 760 KB
english, 2014
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