Influence of Preferred Gate Metal Grain Orientation on...

IEEE Transactions on Electron Devices 2015 / 4 Vol. 62; Iss. 4

Influence of Preferred Gate Metal Grain Orientation on Tunneling FETs

Choi, Kyoung Min, Lee, Won-Sok, Lee, Keun-Ho, Park, Young-Kwan, Choi, Woo Young
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2399018
Date:
April, 2015
File:
PDF, 1.25 MB
english, 2015
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