AC-Capacitance Techniques for Interface Trap Analysis in...

IEEE Transactions on Electron Devices 2015 / 6 Vol. 62; Iss. 6

AC-Capacitance Techniques for Interface Trap Analysis in GaN-Based Buried-Channel MIS-HEMTs

Yang, Shu, Liu, Shenghou, Lu, Yunyou, Liu, Cheng, Chen, Kevin J.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2420690
Date:
June, 2015
File:
PDF, 2.00 MB
english, 2015
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