Variation-Aware Figure of Merit for Integrated Circuit in...

IEEE Transactions on Electron Devices 2015 / 6 Vol. 62; Iss. 6

Variation-Aware Figure of Merit for Integrated Circuit in Near-Threshold Region

Jeong, Hanwool, Yang, Younghwi, Song, Seung Chul, Wang, Joseph, Yeap, Geoffrey, Jung, Seong-Ook
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2424220
Date:
June, 2015
File:
PDF, 3.20 MB
english, 2015
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