SOI FinFET nFET-to-pFET Tracking Variability Compact...

IEEE Transactions on Electron Devices 2015 / 6 Vol. 62; Iss. 6

SOI FinFET nFET-to-pFET Tracking Variability Compact Modeling and Impact on Latch Timing

Deng, Jie, Rahman, Ardasheir, Thoma, Rainer, Schneider, Peter W., Johnson, Jim, Trombley, Henry, Lu, Ning, Williams, Richard Q., Nayfeh, Hasan M., Zhao, Kai, Robison, Russ, Guan, Ximeng, Zamdmer, Noah
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2423634
Date:
June, 2015
File:
PDF, 3.00 MB
english, 2015
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