Analysis of the Excellent Memory Disturb Characteristics of a Hourglass-Shaped Filament in Al2O3/Cu-Based CBRAM Devices
Belmonte, Attilio, Celano, Umberto, Redolfi, Augusto, Fantini, Andrea, Muller, Robert, Vandervorst, Wilfried, Houssa, Michel, Jurczak, Malgorzata, Goux, LudovicVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2015.2423094
Date:
June, 2015
File:
PDF, 1.73 MB
english, 2015