Microstructural Characterization of Recombination-Induced Stacking Faults in High-Voltage SiC Diodes
Liu, Jin Qiang, Skowronski, Marek, Hallin, Christer, Söderholm, R., Lendenmann, H.Volume:
389-393
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.389-393.1281
File:
PDF, 380 KB
2002