Microstructural Characterization of Recombination-Induced...

Microstructural Characterization of Recombination-Induced Stacking Faults in High-Voltage SiC Diodes

Liu, Jin Qiang, Skowronski, Marek, Hallin, Christer, Söderholm, R., Lendenmann, H.
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Volume:
389-393
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.389-393.1281
File:
PDF, 380 KB
2002
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