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4H-SiC IMPATT Diode Fabrication and Testing
Vassilevski, Konstantin V., Zorenko, A.V., Zekentes, K., Tsagaraki, Katerina, Bano, Edwige, Banc, C., Lebedev, A.A.Volume:
389-393
Year:
2002
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/msf.389-393.1353
File:
PDF, 606 KB
2002