Special section on defect and fault tolerance in VLSI...

Microelectronics Journal 2003 Vol. 34; Iss. 1

Special section on defect and fault tolerance in VLSI systems

Régis Leveugle, Glenn Chapman
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Volume:
34
Year:
2003
Language:
english
DOI:
10.1016/s0026-2692(02)00123-4
File:
PDF, 39 KB
english, 2003
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