Volume 34; Issue 1

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Microelectronics Journal
Volume 34; Issue 1

Microelectronics Journal

Volume 34; Issue 1

1

Data structures with C++ using STL, 2/e: William Ford, William Top (Eds.); Prentice Hall, Upper Saddle River, NJ, 2002, 1037 pages, hardcover, ISBN 0-13-085850-1, plus XXVI

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 48 KB

english, 2003

2

Analog signal generator for BIST of wideband IF signals bandpass sigma–delta modulator

Feng Huang, Xubang Shen, Xuecheng Zou, Chaoyang Chen

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 370 KB

english, 2003

3

Special section on defect and fault tolerance in VLSI systems

Régis Leveugle, Glenn Chapman

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 39 KB

english, 2003

4

Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults

C. Metra, S. Di Francescantonio, M. Favalli, B. Riccò

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 139 KB

english, 2003

5

Concurrent error detection of fault-based side-channel cryptanalysis of 128-bit RC6 block cipher

Kaijie Wu, Piyush Mishra, Ramesh Karri

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 337 KB

english, 2003

6

New techniques for efficiently assessing reliability of SOCs

P Civera, L Macchiarulo, M Rebaudengo, M Sonza Reorda, M Violante

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 312 KB

english, 2003

7

Study, comparison and application of different VHDL-based fault injection techniques for the experimental validation of a fault-tolerant system

D Gil, J Gracia, J.C Baraza, P.J Gil

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 379 KB

english, 2003

8

Numerical investigation of characteristics of p-channel Ge/Si hetero-nanocrystal memory

H.G. Yang, Y. Shi, L. Pu, S.L. Gu, B. Shen, P. Han, R. Zhang, Y.D. Zhang

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 276 KB

english, 2003

9

Parallel testing of multi-port static random access memories

F. Karimi, S. Irrinki, T. Crosby, N. Park, F. Lombardi

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 580 KB

english, 2003

10

The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy

Kwang-Su Lee, Toh-Ming Lu, X.-C Zhang

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 195 KB

english, 2003

11

Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor

N. Kaushik, A. Kranti, M. Gupta, R.S. Gupta

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 178 KB

english, 2003

12

Editorial Board

Journal:

Microelectronics Journal

Year:

2003

Language:

english

File:

PDF, 29 KB

english, 2003

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