Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults
C. Metra, S. Di Francescantonio, M. Favalli, B. RiccòVolume:
34
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0026-2692(02)00125-8
File:
PDF, 139 KB
english, 2003