On the optimum thickness to test dielectric reliability, in...

On the optimum thickness to test dielectric reliability, in an integrated technology of power devices

Slimane Oussalah, Fabien Nebel, Robert Jérisian
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Volume:
40
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0026-2714(00)00074-3
File:
PDF, 134 KB
english, 2000
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