![](/img/cover-not-exists.png)
On the optimum thickness to test dielectric reliability, in an integrated technology of power devices
Slimane Oussalah, Fabien Nebel, Robert JérisianVolume:
40
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0026-2714(00)00074-3
File:
PDF, 134 KB
english, 2000