Volume 40; Issue 12

Microelectronics Reliability

Volume 40; Issue 12

1

Back gate bias method of threshold voltage control for the design of low voltage CMOS ternary logic circuits

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 90 KB

english, 2000

2

Total dose response studies of n-channel SOI MOSFETs for low power CMOS circuits

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 155 KB

english, 2000

3

High resolution thermal simulation of electronic components

G Hanreich, J Nicolics, L Musiejovsky

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 338 KB

english, 2000

4

Estimation of the reliability of digital systems implemented on programmable devices

Igor V. Vasiltsov, Bogdan A. Mandziy

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 371 KB

english, 2000

5

IC’s radiation effects modeling and estimation

V.V Belyakov, A.I Chumakov, A.Y Nikiforov, V.S Pershenkov, P.K Skorobogatov, A.V Sogoyan

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 358 KB

english, 2000

6

The effect of polyimide surface chemistry and morphology on critical stress intensity factor

Masazumi Amagai

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 490 KB

english, 2000

7

Plasma-charging damage in ultra-thin gate oxide

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 294 KB

english, 2000

8

Rise-time effects in grounded gate nMOS transistors under transmission line pulse stress

Gianluca Boselli, Ton Mouthaan, Fred Kuper

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 225 KB

english, 2000

9

On the optimum thickness to test dielectric reliability, in an integrated technology of power devices

Slimane Oussalah, Fabien Nebel, Robert Jérisian

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 134 KB

english, 2000

10

A new hole mobility model for hydrodynamic simulation

Chanho Lee, Jung-Sik Kim, Hyungsoon Shin, Young-June Park, Hong-Shick Min

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 106 KB

english, 2000

11

Time-dependent dielectric wearout technique with temperature effect for reliability test of ultrathin (

Yider Wu, Qi Xiang, Jean Y.M. Yang, Gerald Lucovsky, Ming-Ren Lin

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 445 KB

english, 2000

12

The influence of adatom diffusion on coverage and emission current fluctuations

A.A. Tarasenko, F. Nieto, L. Jastrabı́k, C. Uebing

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 191 KB

english, 2000

13

Index

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 52 KB

english, 2000

14

Bulk oxide charge and slow states in Si–SiO2 structures generated by RIE-mode plasma

A Paskaleva, E Atanassova

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 95 KB

english, 2000

15

Plasma charging damage during contact hole etch in high-density plasma etcher

Bing-Yue Tsui, Shyue-Shyh Lin, Chia-Shone Tsai, Chin C Hsia

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 476 KB

english, 2000

16

High-performance System Design: Circuits and Logic; Vojin Oklobdzija (Ed.), IEEE Press Series on Microelectronic Systems, New York, 1999. Hardcover, 537 pp., IEEE Order No. PC 5765, ISBN: 0-7803-4716-1, $110

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 45 KB

english, 2000

17

Concurrent testing in high level synthesis

A.A. Ismaeel, R. Bhatnagar, R. Mathew

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 375 KB

english, 2000

18

The Burr type XII distribution as a failure model under various loss functions

Deborah Moore, Alex S. Papadopoulos

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 82 KB

english, 2000

19

The peaks in the electric derivative curves and optic derivative curves of GaAs/GaAlAs high-power QW lasers

Qi Liyun, Shi Jiawei, Li Hongyan, Jin Enshun, Gao Dingsan

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 107 KB

english, 2000

20

A grain structure based statistical simulation of electromigration damage in chip level interconnect lines

T.M. Korhonen, D.D. Brown, M.A. Korhonen

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 233 KB

english, 2000

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