Time-dependent dielectric wearout technique with...

Microelectronics Reliability 2000 Vol. 40; Iss. 12

Time-dependent dielectric wearout technique with temperature effect for reliability test of ultrathin (

Yider Wu, Qi Xiang, Jean Y.M. Yang, Gerald Lucovsky, Ming-Ren Lin
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Volume:
40
Year:
2000
Language:
english
Pages:
9
DOI:
10.1016/s0026-2714(00)00103-7
File:
PDF, 445 KB
english, 2000
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