High temperature reliability testing of aluminum and tantalum electrolytic capacitors
A. Dehbi, W. Wondrak, Y. Ousten, Y. DantoVolume:
42
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(02)00021-5
File:
PDF, 225 KB
english, 2002