Volume 42; Issue 6

Microelectronics Reliability

Volume 42; Issue 6

1

Modeling of the I–V characteristics of high-field stressed MOS structures using a Fowler–Nordheim-type tunneling expression

E. Miranda, G. Redin, A. Faigón

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 310 KB

english, 2002

2

The effects of in-plane orthotropic properties in a multi-chip ball grid array assembly

Thomas D. Moore, John L. Jarvis

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 202 KB

english, 2002

3

Reliability of thin-film resistors: impact of third harmonic screenings

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 395 KB

english, 2002

4

Noise and transport characterisation of tantalum capacitors

Jan Pavelka, Josef Sikula, Petr Vasina, Vlasta Sedlakova, Munecazu Tacano, Sumihisa Hashiguchi

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 295 KB

english, 2002

5

Highly accelerated lifetesting of base-metal-electrode ceramic chip capacitors

Jonathan L. Paulsen, Erik K. Reed

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 508 KB

english, 2002

6

Mechanical characterization of Sn–Ag-based lead-free solders

Masazumi Amagai, Masako Watanabe, Masaki Omiya, Kikuo Kishimoto, Toshikazu Shibuya

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 1.01 MB

english, 2002

7

Investigation of a constant behavior of aliasing errors in signature analysis due to the use of different ordered test-patterns in LFSR based testing techniques

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 191 KB

english, 2002

8

ESR concerns in tantalum chip capacitors exposed to non-oxygen-containing environments

Jocelyn Siplon, Gary J. Ewell, Thomas Gibson

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 280 KB

english, 2002

9

High temperature reliability testing of aluminum and tantalum electrolytic capacitors

A. Dehbi, W. Wondrak, Y. Ousten, Y. Danto

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 225 KB

english, 2002

10

Minimizing equivalent series resistance measurement errors

Gregory L. Amorese

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 551 KB

english, 2002

11

Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies

Cynthia A. Torres, James W. Miller, Michael Stockinger, Matthew D. Akers, Michael G. Khazhinsky, James C. Weldon

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 735 KB

english, 2002

12

Development of substrate-pumped nMOS protection for a 0.13 μm technology

Craig Salling, Jerry Hu, Jeff Wu, Charvaka Duvvury, Roger Cline, Rith Pok

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 446 KB

english, 2002

13

Erratum to “The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures” [Microelectronics Reliability 2001;41:927–931]

Lingfeng Mao, Changhua Tan, Mingzhen Xu

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 30 KB

english, 2002

14

Special Section on Reliability of Passive Components

Wolfgang Wondrak

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 24 KB

english, 2002

15

Dependability of Engineering Systems: J.M. Nahman, Springer-Verlag, Berlin, Heidelberg, New York, 2002, 192 pages

Ninoslav Stojadinovic

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 31 KB

english, 2002

16

Calendar of forthcoming events

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 34 KB

english, 2002

17

Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction

Fuchen Mu, Mingzhen Xu, Changhua Tan, Xiaorong Duan

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 115 KB

english, 2002

18

A novel approach for fabricating light-emitting porous polysilicon films

P.G. Han, Hei Wong, Andy H.P. Chan, M.C. Poon

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 268 KB

english, 2002

19

Impact of circuit resistance on the breakdown voltage of tantalum chip capacitors

Erik K. Reed, Jonathan L. Paulsen

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 357 KB

english, 2002

20

Efficient test pattern generators based on specific cellular automata structures

T. Garbolino, A. Hławiczka

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 307 KB

english, 2002

21

Failure modes of tantalum capacitors made by different technologies

P Vasina, T Zednicek, J Sikula, J Pavelka

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 898 KB

english, 2002

22

On-Chip ESD

Markus P.J. Mergens

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 30 KB

english, 2002

23

ESD protection design for CMOS RF integrated circuits using polysilicon diodes

Ming-Dou Ker, Chyh-Yih Chang

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 399 KB

english, 2002

24

Significance of the failure criterion on transmission line pulse testing

B. Keppens, V. De Heyn, M. Natarajan Iyer, V. Vassilev, G. Groeseneken

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 512 KB

english, 2002

25

Correlation considerations: Real HBM to TLP and HBM testers

Jon Barth, John Richner

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 291 KB

english, 2002

26

Charged device model metrology: limitations and problems

Leo G. Henry, Jon Barth, Hugh Hyatt, Tom Diep, Michael Stevens

Journal:

Microelectronics Reliability

Year:

2002

Language:

english

File:

PDF, 214 KB

english, 2002

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Tor version

Z-Library

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски