Erratum to “The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures” [Microelectronics Reliability 2001;41:927–931]
Lingfeng Mao, Changhua Tan, Mingzhen XuVolume:
42
Year:
2002
Language:
english
DOI:
10.1016/s0026-2714(02)00072-0
File:
PDF, 30 KB
english, 2002