A TCAD comparative study of power rectifiers: modified...

Microelectronics Reliability 2003 Vol. 43; Iss. 2

A TCAD comparative study of power rectifiers: modified P–i–N vs. modified mosaic contact P–i–N diode

H.E. Aldrete-Vidrio, J.L. del Valle, J. Santana-Corte
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Volume:
43
Year:
2003
Language:
english
Pages:
8
DOI:
10.1016/s0026-2714(02)00287-1
File:
PDF, 529 KB
english, 2003
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