Volume 43; Issue 2

Microelectronics Reliability

Volume 43; Issue 2

1

Modified micro–macro thermo-mechanical modelling of ceramic ball grid array packages

Bart Vandevelde, Dominiek Degryse, Eric Beyne, Eric Roose, Dorina Corlatan, Guido Swaelen, Geert Willems, Filip Christiaens, Alcatel Bell, Dirk Vandepitte, Martine Baelmans

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 891 KB

english, 2003

2

Blazed diffraction gratings fabricated using X-ray lithography: fabrication, modeling and simulation

Paul Isaac Hagouel

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 304 KB

english, 2003

3

Low frequency noise in 0.12 μm partially and fully depleted SOI technology

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 269 KB

english, 2003

4

Investigation of reliability issues in high power laser diode bar packages

Ajit R. Dhamdhere, Ajay P. Malshe, William F. Schmidt, William D. Brown

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 421 KB

english, 2003

5

Guest Editorial

Juan Santana, Magali Estrada

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 32 KB

english, 2003

6

A TCAD comparative study of power rectifiers: modified P–i–N vs. modified mosaic contact P–i–N diode

H.E. Aldrete-Vidrio, J.L. del Valle, J. Santana-Corte

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 529 KB

english, 2003

7

FD MOS SOI circuit to enhance the ratio of illuminated to dark current of a co-integrated a-Si:H photodiode

M. Estrada, A. Afzalian, D. Flandre, A. Cerdeira, H. Baez, A. de Lucca

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 148 KB

english, 2003

8

An analog median filter with fuzzy adaptation

Javier Lemus-López, Alejandro Dı&amp, #x0301, az-Sánchez, Jaime Ramı&amp, #x0301, rez-Angulo

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 292 KB

english, 2003

9

Miriã: a CAD tool to synthesize multi-burst controllers for heterogeneous systems

D Lopes de Oliveira, M Strum, W.J Chau, W.C Cunha

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 160 KB

english, 2003

10

MSOH processor for STM-0/STS-1 to STM-4/STS-12: component of a SDH/SONET library

D. Torres, A. Redondo, M.E. Guzmán

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 144 KB

english, 2003

11

Effect of autoclave test on anisotropic conductive joints

C.W. Tan, Y.C. Chan, N.H. Yeung

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 457 KB

english, 2003

12

Fracture strength characterization and failure analysis of silicon dies

J.D Wu, C.Y Huang, C.C Liao

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 589 KB

english, 2003

13

A study on 1/f noise spectrum generation in nonlinear transmission media and biomedical systems

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 87 KB

english, 2003

14

Thermal modeling of localized laser heating in multi-level interconnects

Paiboon Tangyunyong

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 722 KB

english, 2003

15

Power saving modes in modern microcontroller design, diagnostics and reliability

Saša A Janković, Dejan M Maksimović

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 129 KB

english, 2003

16

Calendar for forthcoming events

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 41 KB

english, 2003

17

Effects of fourth alloying additive on microstructures and tensile properties of Sn–Ag–Cu alloy and joints with Cu

K.S. Kim, S.H. Huh, K. Suganuma

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 837 KB

english, 2003

18

Advances in SiC power MOSFET technology

Sima Dimitrijev, Philippe Jamet

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 206 KB

english, 2003

19

A new drain current model for short-channel MOSFETs

Sadegh Abbasian, Ebrahim Farjah

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 186 KB

english, 2003

20

Base transit time of an epitaxial n+pn−n+ bipolar transistor considering Kirk effect

M.M. Shahidul Hassan

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 103 KB

english, 2003

21

Fabrication, characterisation and modelling of integrated on-silicon inductors

R. Murphy-Arteaga, J. Huerta-Chua, A. Dı&amp, #x0301, az-Sánchez, A. Torres-Jacome, W. Calleja-Arriaga, M. Landa-Vázquez

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 231 KB

english, 2003

22

Electrical properties of thin RF sputtered Ta2O5 films after constant current stress

M. Pecovska-Gjorgjevich, N. Novkovski, E. Atanassova

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 290 KB

english, 2003

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