Effect of autoclave test on anisotropic conductive joints

Microelectronics Reliability 2003 Vol. 43; Iss. 2

Effect of autoclave test on anisotropic conductive joints

C.W. Tan, Y.C. Chan, N.H. Yeung
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Volume:
43
Year:
2003
Language:
english
Pages:
7
DOI:
10.1016/s0026-2714(02)00293-7
File:
PDF, 457 KB
english, 2003
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