Improvement of integrated circuit testing reliability by...

Improvement of integrated circuit testing reliability by using the defect based approach

Dominik Kasprowicz, Witold A. Pleskacz
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Volume:
43
Year:
2003
Language:
english
Pages:
9
DOI:
10.1016/s0026-2714(03)00092-1
File:
PDF, 244 KB
english, 2003
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