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Volume 43; Issue 6
Main
Microelectronics Reliability
Volume 43; Issue 6
Microelectronics Reliability
Volume 43; Issue 6
1
Wafer level packaging having bump-on-polymer structure
John J.H. Reche
,
Deok-Hoon Kim
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 655 KB
Your tags:
english, 2003
2
The radiation sensitivity mapping of ICs using an IR pulsed laser system
B. Alpat
,
R. Battiston
,
M. Bizzarri
,
D. Caraffini
,
E. Fiori
,
A. Papi
,
M. Petasecca
,
A. Pontetti
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 224 KB
Your tags:
english, 2003
3
Hot electron induced degradation of undoped AlGaN/GaN HFETs
Hyungtak Kim
,
Alexei Vertiatchikh
,
Richard M. Thompson
,
Vinayak Tilak
,
Thomas R. Prunty
,
James R. Shealy
,
Lester F. Eastman
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 180 KB
Your tags:
english, 2003
4
Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE
F. Brunner
,
A. Braun
,
P. Kurpas
,
J. Schneider
,
J. Würfl
,
M. Weyers
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 187 KB
Your tags:
english, 2003
5
Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process
William J. Rowe
,
Bruce M. Paine
,
Adele E. Schmitz
,
Robert H. Walden
,
Michael J. Delaney
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 178 KB
Your tags:
english, 2003
6
The effects of ternary alloys on thermal resistances of HBTs, HEMTs, and laser diodes
Bruce M. Paine
,
Ami P. Shah
,
Thomas Rust III
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 116 KB
Your tags:
english, 2003
7
Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares
Charles S. Whitman
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 121 KB
Your tags:
english, 2003
8
Solder joint reliability of TFBGA assemblies with fresh and reworked solder balls
Po-Jen Zheng
,
J.Z. Lee
,
K.H. Liu
,
J.D. Wu
,
S.C. Hung
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 286 KB
Your tags:
english, 2003
9
Direct gold and copper wires bonding on copper
Hong Meng Ho
,
Wai Lam
,
Serguei Stoukatch
,
Petar Ratchev
,
Charles J. Vath III
,
Eric Beyne
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 697 KB
Your tags:
english, 2003
10
Improvement of integrated circuit testing reliability by using the defect based approach
Dominik Kasprowicz
,
Witold A. Pleskacz
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 244 KB
Your tags:
english, 2003
11
High-voltage pulse stressing of thick-film resistors and noise
I. Stanimirović
,
M.M. Jevtić
,
Z. Stanimirović
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 220 KB
Your tags:
english, 2003
12
Novel high performance CMOS current conveyor
Belén Calvo
,
Santiago Celma
,
Pedro A. Martı́nez
,
M. Teresa Sanz
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 194 KB
Your tags:
english, 2003
13
Room temperature plasma oxidation mechanism to obtain ultrathin silicon oxide and titanium oxide layers
J.C. Tinoco
,
M. Estrada
,
G. Romero
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 252 KB
Your tags:
english, 2003
14
Calendar of forthcoming events
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 38 KB
Your tags:
english, 2003
15
Editorial
Wallace T. Anderson
,
Roberto Menozzi
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 32 KB
Your tags:
english, 2003
16
High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications
Frank Gao
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 562 KB
Your tags:
english, 2003
17
Thin dielectric reliability assessment for DRAM technology with deep trench storage node
R.-P. Vollertsen
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 392 KB
Your tags:
english, 2003
18
Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations
Takeshi Yanagisawa
,
Takeshi Kojima
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 109 KB
Your tags:
english, 2003
19
Numerical study on the bonding tool position, tip profile and planarity angle influences on TAB/ILB interconnection reliability
D.S. Liu
,
Y.C. Chao
,
C.H. Lin
,
G.S. Shen
,
H.S. Liu
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 453 KB
Your tags:
english, 2003
20
Manufacturing capability control for multiple power-distribution switch processes based on modified Cpk MPPAC
W.L. Pearn
,
Ming-Hung Shu
Journal:
Microelectronics Reliability
Year:
2003
Language:
english
File:
PDF, 208 KB
Your tags:
english, 2003
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