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An examination of the applicability of the DNP metric on first level reliability assessments in underfilled electronic packages
W. Dauksher, W.S. BurtonVolume:
43
Year:
2003
Language:
english
Pages:
10
DOI:
10.1016/s0026-2714(03)00219-1
File:
PDF, 399 KB
english, 2003