![](/img/cover-not-exists.png)
Design of a new test structure for the study of electromigration with early resistance change measurements
W. De Ceuninck, J. Manca, V. D'Haeger, J. Van Olmen, L. De Schepper, L.M. StalsVolume:
37
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(97)00014-0
File:
PDF, 277 KB
english, 1997