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Volume 37; Issue 12
Main
Microelectronics Reliability
Volume 37; Issue 12
Microelectronics Reliability
Volume 37; Issue 12
1
Robustness of the exponential sequential probability ratio test (SPRT) when Weibull distributed failures are transformed using a “known” shape parameter
Daryl J. Hauck
,
J.Bert Keats
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 458 KB
Your tags:
english, 1997
2
Design of a new test structure for the study of electromigration with early resistance change measurements
W. De Ceuninck
,
J. Manca
,
V. D'Haeger
,
J. Van Olmen
,
L. De Schepper
,
L.M. Stals
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 277 KB
Your tags:
english, 1997
3
Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturing
W.L. Pearn
,
K.S. Chen
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 478 KB
Your tags:
english, 1997
4
Weaknesses of the conventional three-state model in station-oriented reliability evaluation
R. Billinton
,
Hua Chen
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 473 KB
Your tags:
english, 1997
5
Shortest bayes credibility intervals for the lognormal failure model
Keh-Wei Chen
,
Alex S. Papadopoulos
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 329 KB
Your tags:
english, 1997
6
A note on expected Fisher information for the Burr XII distribution
A.J. Watkins
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 239 KB
Your tags:
english, 1997
7
Calendar of forthcoming events
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 534 KB
Your tags:
english, 1997
8
Procedure for evaluation of thermal management requirements in a laser diode structure
Rajesh R. Kamath
,
Patricia F. Mead
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 461 KB
Your tags:
english, 1997
9
World abstract on microelectronics and reliability 1. Realibility—General
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 1.78 MB
Your tags:
english, 1997
10
LSI failure analysis using focused laser beam heating
Kiyoshi Nikawa
,
Shoji Inoue
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 537 KB
Your tags:
english, 1997
11
Efficient critical area measurements of IC layout applied to quality and reliability enhancement
Gerard A. Allan
,
Anthony J. Walton
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 758 KB
Your tags:
english, 1997
12
A survey of the thermal stability of an active heat sink
Erwin De Baetselier
,
Wim Goedertier
,
Gilbert De Mey
Journal:
Microelectronics Reliability
Year:
1997
Language:
english
File:
PDF, 600 KB
Your tags:
english, 1997
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