Change in d.c. and 1/f noise characteristics of n-submicron MOSFETs due to hot-carrier degradation
L.K.J. Vandamme, X. LiVolume:
38
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0026-2714(97)00072-3
File:
PDF, 142 KB
english, 1998