Volume 38; Issue 1

Microelectronics Reliability

Volume 38; Issue 1
2

The modeling of resistance changes in the early phase of electromigration

Ton J Mouthaan, Violeta Petrescu
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 405 KB
english, 1998
3

Component level ESD testing

Koen Verhaege
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 476 KB
english, 1998
6

Using charged device model testing to eliminate real-world ESD failures

Andrew H. Olney
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 588 KB
english, 1998
8

Reliability phenomena under AC stress

Chenming Hu
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 250 KB
english, 1998
9

Dielectric Reliability Measurement Methods: A Review

Andreas Martin, Paula O'Sullivan, Alan Mathewson
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 1.10 MB
english, 1998
10

Editorial

Journal:
Microelectronics Reliability
Year:
1998
File:
PDF, 52 KB
1998
11

Linewidth control effects on MOSFET ESD robustness

S Voldman, J Never, S Holmes, J Adkisson
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 1.04 MB
english, 1998
12

Degradation mechanism of GaAs MESFETs

Jae Kyoung Mun, Jong-Lam Lee, Haecheon Kim, Byung-Taek Lee, Jae Jin Lee, Kwang-Eui Pyun
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 299 KB
english, 1998
13

Reliability of III–V based heterojunction bipolar transistors

K.A Christianson
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 251 KB
english, 1998
17

Hot-carrier injections in SiO2

D Vuillaume, A Bravaix, D Goguenheim
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 473 KB
english, 1998