Plastic-encapsulated microcircuit reliability and cost-effectiveness study : Douglas Emerson, Edward Hakim and Anand Govind. IEEE Transactions on Reliability, 45 (1), 19 (1996)
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Volume:
37
Year:
1997
Language:
english
Pages:
2
DOI:
10.1016/s0026-2714(97)87668-8
File:
PDF, 290 KB
Your tags:
english, 1997
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