Tutorial: temperature as an input to...

Tutorial: temperature as an input to microelectronics-reliability models : Pradeep Lall. IEEE Transactions on Reliability, 45 (1), 3 (1996)

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Volume:
37
Year:
1997
Language:
english
DOI:
10.1016/s0026-2714(97)87699-8
File:
PDF, 145 KB
english, 1997
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