Lateral electron depletion in focused-ion-beam implanted...

Lateral electron depletion in focused-ion-beam implanted pseudomorphic heterostructures with InxGa1−xAs channels : D. K. De Vries, H. Kunzel, K. Hausler, K. H. Ploog and A. D. Wieck Solid-State Electronics, 40 (1–8), 637 (1996)

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Volume:
37
Year:
1997
Language:
english
Pages:
2
DOI:
10.1016/s0026-2714(97)87763-3
File:
PDF, 247 KB
english, 1997
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