A correlation study between different types of CDM testers and ‘real’ manufacturing in-line leakage failure : Michael D. Chaine, Chen Teck Liong and Ho Fock San. IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part A, 18 (2) 295 (June 1995).
Volume:
37
Year:
1997
Language:
english
DOI:
10.1016/s0026-2714(97)87782-7
File:
PDF, 115 KB
english, 1997