Extraction method for source series resistance and...

Microelectronics Reliability 1998 Vol. 38; Iss. 5

Extraction method for source series resistance and transverse field mobility reduction coefficient using the MOSFET saturation region

A.M. Ionescu, A. Chovet, A.E. Popescu, A. Rusu, D. Steriu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
38
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00024-9
File:
PDF, 365 KB
english, 1998
Conversion to is in progress
Conversion to is failed