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Volume 38; Issue 5
Main
Microelectronics Reliability
Volume 38; Issue 5
Microelectronics Reliability
Volume 38; Issue 5
1
Book review
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 84 KB
Your tags:
english, 1998
2
The electrical properties of Al/Ni/Ge/n-GaAs interfaces
L. Dávid
,
B. Kovács
,
I. Mojzes
,
Zs. Kincses
,
L. Dobos
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 471 KB
Your tags:
english, 1998
3
Use of C-SAM acoustical microscopy in package evaluations and failure analysis
S Atkins
,
L Teems
,
W Rowe
,
P Selby
,
R Vaughters
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 1.17 MB
Your tags:
english, 1998
4
Better graphs for dependability modeling
Winfrid G. Schneeweiss
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 564 KB
Your tags:
english, 1998
5
Facet heating and axial temperature profiles in high-power GaAlAs/GaAs laser diodes
U. Menzel
,
R. Puchert
,
A. Bärwolff
,
A. Lau
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 236 KB
Your tags:
english, 1998
6
Book review
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 73 KB
Your tags:
english, 1998
7
A different approach to the analysis of data in life-tests of laser diodes
A. Bonfiglio
,
M.B. Casu
,
F. Magistrali
,
M. Maini
,
G. Salmini
,
M. Vanzi
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 257 KB
Your tags:
english, 1998
8
Extraction method for source series resistance and transverse field mobility reduction coefficient using the MOSFET saturation region
A.M. Ionescu
,
A. Chovet
,
A.E. Popescu
,
A. Rusu
,
D. Steriu
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 365 KB
Your tags:
english, 1998
9
Transient behavior and low VDS hysteresis in PD SOI MOSFETs
L.M Perron
,
C Hamaguchi
,
A.L Lacaita
,
S Maegawa
,
Y Yamaguchi
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 389 KB
Your tags:
english, 1998
10
Availability modeling of energy management systems
Ricardo M. Fricks
,
Kishor S. Trivedi
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 484 KB
Your tags:
english, 1998
11
Influence of the silicon nitride oxidation on the performances of NCLAD isolation
A. Tixier
,
V. Senez
,
B. Baccus
,
A. Marmiroli
,
P. Colpani
,
A. Rebora
,
G.P. Carnevale
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 957 KB
Your tags:
english, 1998
12
Carrier mobility in inversion layers of Si–thin Ta2O5 structures
E. Atanassova
,
T. Dimitrova
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 242 KB
Your tags:
english, 1998
13
Electrical properties of thin Ta2O5 films obtained by thermal oxidation of Ta on Si
E. Atanassova
,
D. Spassov
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 275 KB
Your tags:
english, 1998
14
Characterization of the silicon nitride–thermal oxide interface in oxide–nitride–oxide structures by ELS, XPS, ellipsometry, and numerical simulation
V.A. Gritsenko
,
S.N. Svitasheva
,
I.P. Petrenko
,
Yu.N. Novikov
,
Yu.N. Morokov
,
Hei Wong
,
R.W.M. Kwok
,
R.W.M. Chan
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 330 KB
Your tags:
english, 1998
15
Long-term base current instability in AlGaAs/GaAs HBTs: physical mechanisms, modeling, and SPICE simulation
J.J. Liou
Journal:
Microelectronics Reliability
Year:
1998
Language:
english
File:
PDF, 1.50 MB
Your tags:
english, 1998
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