A new method for extracting the effective channel length of...

Microelectronics Reliability 1998 Vol. 38; Iss. 12

A new method for extracting the effective channel length of MOSFETs

A. Ortiz-Conde, J.J. Liou, F.J. Garcı́a Sánchez, E.Gouveia Fernandes, O.Montilla Castillo, M.D.Rofiqul Hassan, G. De Mercato
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Volume:
38
Year:
1998
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(98)00070-5
File:
PDF, 225 KB
english, 1998
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