Volume 38; Issue 12

Microelectronics Reliability

Volume 38; Issue 12

1

The effects of duty cycle and voltage swing of gate pulse on the AC-stress-induced degradation of nMOSFETs with N2O gate oxides

X Zeng, P.T Lai, J.P Xu

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 245 KB

english, 1998

2

Cut off frequency and transit time analysis of lightly doped drain (LDD) MOSFETs

Ciby Thomas, S. Haldar, Manoj Khanna, S. Rajesh, K.K. Gupta, R.S. Gupta

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 342 KB

english, 1998

3

Application of 1/f noise measurements to the characterization of near-interface oxide traps in ULSI n-MOSFETs

S. Villa, G. De Geronimo, A. Pacelli, A.L. Lacaita, A. Longoni

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 185 KB

english, 1998

4

A new method for extracting the effective channel length of MOSFETs

A. Ortiz-Conde, J.J. Liou, F.J. Garcı́a Sánchez, E.Gouveia Fernandes, O.Montilla Castillo, M.D.Rofiqul Hassan, G. De Mercato

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 225 KB

english, 1998

5

Total dose effects on power-MOSFET switching converters

J.E Pizano, T.H Ma, J.O Attia, R.D Schrimpf, K.F Galloway, A.F Witulski

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 324 KB

english, 1998

6

Application of a ‘surrogate’ layer for lower bending stress in a vulnerable material of a tri-material body

E. Suhir, J.D. Weld

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 261 KB

english, 1998

7

Finite element analysis for solder ball failures in chip scale package

Taekoo Lee, Jinhyuk Lee, Ilgyu Jung

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 414 KB

english, 1998

8

The effects of SiO2 barrier between active layer and substrate on the performance and reliability of polycrystalline silicon thin film transistors

Y.Z Wang, O.O Awadelkarim

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 571 KB

english, 1998

9

Low temperature delamination of plastic encapsulated microcircuits

P McCluskey, F Lilie, O Beysser, A Gallo

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 251 KB

english, 1998

10

A case study of IC storage failures in Taipei trains

Y Zhang, M Pecht, L Lantz

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 558 KB

english, 1998

11

Degradation of AlGaAs/GaAs HBTs induced by hot carriers

Chung-Kun Song, Duk-Young Kim, Pun-Jae Choi, Jae-Hoon Choi, Do-Hyun Kim

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 320 KB

english, 1998

12

Laser-based electro-optic testing of multichip module structures

D.M. Mechtel, H.K. Charles Jr., A.S. Francomacaro

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 414 KB

english, 1998

13

Microchannel gate temperature analysis

Q. Kim, S. Kayali

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 442 KB

english, 1998

14

On the determination of the time-dependent degradation laws and device lifetime in deep submicron n- and p- channel SOI MOSFETs

S.-H Renn, F Balestra

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 392 KB

english, 1998

15

Book review

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 88 KB

english, 1998

16

Studies on the heat removal features of stacked SOI structures with a dedicated field solver program (SUNRED)

Zs Kohári, V Székely, M Rencz, A Páhl, V Dudek, B Höfflinger

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 1.28 MB

english, 1998

17

Hydrostatic high pressure studies of polymer thick-film resistors

Andrzej Dziedzic, Artur Magiera, Roland Winśiewski

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 236 KB

english, 1998

18

The effects of process induced gate-to-source/drain junction separation in MOSFET structures

David Rowlands, Sima Dimitrijev, H.Barry Harrison

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 2.34 MB

english, 1998

19

Index

Journal:

Microelectronics Reliability

Year:

1998

File:

PDF, 94 KB

1998

20

New positive charge trapping dynamics in SiO2 gate oxide, based on bulk impact ionization processes under Fowler–Nordheim stress

Piyas Samanta, C.K. Sarkar

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 262 KB

english, 1998

21

Multi-function protective relay on FPGA

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 234 KB

english, 1998

22

Rapid IC performance yield and distribution prediction using a rotation of the circuit parameter principals components

John Horan, C. Lyden

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 1.64 MB

english, 1998

23

Design rule related defects formation

Y.F. Hsieh, B.Y. Tsui

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 924 KB

english, 1998

24

Power rectifier model including self heating effects

Antonio G.M. Strollo, Ettore Napoli

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 354 KB

english, 1998

25

Analysis method of pooled data for accelerated life testing

T. Seki, S. Yokoyama

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 229 KB

english, 1998

26

Book review

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 120 KB

english, 1998

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