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A new test method for contactless quantitative current measurement via scanning magneto-resistive probe microscopy
S. Bae, A. Schlensog, W. Mertin, E. Kubalek, M. MaywaldVolume:
38
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00071-7
File:
PDF, 462 KB
english, 1998