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Scanning near-field optical microscopy analyses of electronic devices
R.M. Cramer, W.R. Schade, R. Heiderhoffo, L.J. Balk, R. ChinVolume:
38
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00082-1
File:
PDF, 472 KB
english, 1998