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Automatic fault tracing by successive circuit extraction from CAD layout data with the CAD-linked EB test system
K. Miura, K. Nakamae, H. FujiokaVolume:
38
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(98)00097-3
File:
PDF, 478 KB
english, 1998