Reliability of industrial packaging for microsystems

Microelectronics Reliability 1998 Vol. 38; Iss. 6-8

Reliability of industrial packaging for microsystems

R. de Reus, C. Christensen, S. Weichel, S. Bouwstra, J. Janting, G. Friis Eriksen, K. Dyrbye, T. Romedahl Brown, J.P. Krog, O. Søndergård Jensen, P. Gravesen
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Volume:
38
Year:
1998
Language:
english
Pages:
10
DOI:
10.1016/s0026-2714(98)00149-8
File:
PDF, 962 KB
english, 1998
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