Extrapolation of cosmic ray induced failures from test to...

Microelectronics Reliability 1998 Vol. 38; Iss. 6-8

Extrapolation of cosmic ray induced failures from test to field conditions for IGBT modules

C. Findeisen, E. Herr, M. Schenkel, R. Schlegel, H.R. Zeller
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Volume:
38
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0026-2714(98)00151-6
File:
PDF, 404 KB
english, 1998
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