Study of the ESD behavior of different clamp configurations...

Study of the ESD behavior of different clamp configurations in a 0.35 μm CMOS technology

C Richier, N Maene, G Mabboux, R Bellens
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Volume:
38
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0026-2714(98)00176-0
File:
PDF, 344 KB
english, 1998
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